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Introduction  
Sn-Pb Properties and Models  
Sn-Ag Properties and Creep Data  
Sn-Ag-Cu Properties and Creep Data  
General Conclusions/ Recommendations  
Acknowledgements  
References  
     
  For more information contact:  
  metallurgy@nist.gov  
 
Sn-Ag-Cu Properties and Creep Data
 
  Overview  
  "SAC" Creep Data  
  Source and Plot of Data  
  Specimens  
  Microstructures  
  Test Procedures  
  "SAC" Creep Data Analysis and Modeling  
  Fit of Kariya's and Schubert's Models  
  Review of SAC Data  
  Regression Analysis  
  Fit of Additional Data to First Order Creep Model  
  Kim et al.'s Data and Effect of Cooling Rate  
  NCMS' Compression Creep Data  
  Flip-Chip Solder Joint Shear Data  
  Addemdum: Microstructure and Cooling Rate Effects  
  Other "SAC" Properties  
  Young's Modulus vs. Temperature  
  Poisson's Ratio  
  Coefficients of Thermal Expansion (CTE)  
  Other Physical Properties  
  Conclusions on SAC Properties  
 

Overview

This section summarizes our review and analysis of isothermal tensile creep data for bulk lead-free solders of composition close to that of the NEMI-selected Sn-3.9Ag-0.6Cu alloy. As with the review of Sn3.5Ag properties, the ultimate goal of this work is to develop preliminary constitutive models for SAC and other NEMI recommended lead-free alloys for use in stress / strain analysis, e.g. Finite Element Analysis (FEA), and solder joint life prediction models. All reviewed data, such as the tabulated creep data in Appendix B, will also be included in a web-based material database.

Literature data was acquired for comparative analysis and to identify gaps and differences among existing datasets:

  • Isothermal bulk solder creep data from publications by Kariya et al., 2001, Schubert / Wiese et al., 2001 and Neu et al., 2001 was tabulated and plotted. Specimen geometry and preparation, as well as a description of the microstructures are summarized. The data covers two orders of magnitude on the stress axis and eight orders of magnitude on the strain rate axis. Test temperature is in the range -55°C to 150°C.
  • The raw data is presented in a tabular format for future inclusion in a materials property database and possible further analysis by others.

The intent of the analysis of the creep data is to develop simple, first-order creep models in an attempt to bridge data from several sources. Sub-datasets that do not fit in are also highlighted and possible reasons are given for differences in trends. It is also hoped that the gathered data will be of use for others to develop more sophisticated creep models. Main findings of this review and analysis are:

  • Although there appears to be a few outliers, and the SAC type alloys have slightly different Ag and Cu weight percentages (including the Sn-2.5Ag-0.8Cu-0.5Sb CastinTM alloy), the creep datasets from three independent sources show first order consistency.
  • Most of the data fit a simple hyperbolic sine creep equation with a stress exponent of 6 and an activation energy of 67.9 kJ/mole (= 0.70 eV).
  • Additional data by Kim et al., 2001, for specimens that were rapidly cooled also fit the first order SAC creep model while data for slowly cooled specimens is offset by two orders of magnitude in terms of creep rates. As expected, cooling rates have a significant effect on mechanical properties (because of differences in microstructures). Those effects are larger than the effect of alloy composition for the alloys that were investigated and will have to be considered in the development of more advanced creep models.
  • The review of SAC data also points to lesser data available at strain rates less then 10-6/sec, stresses less than 10 MPa and temperatures above 75°C or combinations thereof. Future work should consider gathering creep data under those conditions since they are representative of stress conditions experienced by solder joints of electronic assemblies in use.

The results of the creep data analysis are for bulk solder in tension and do not include creep data for small size solder joints as found in actual electronic assemblies or solder joints in shear, although discrepancies between tensile and shear creep models are discussed briefly.

This review of SAC properties is not exhaustive, additional data will be added in when available.


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