Project Title: SOLDER JET PRINTING FOR MICROELECTRONICS
APPLICATIONS
Investigators: Frank W. Gayle, Carol A. Handwerker, Leonard C. Smith, and Maureen E.
Williams
Technical Description:
The printing of solder patterns onto chips or circuit boards using ink jet printer technology is
a novel means to avoid cumbersome screening techniques and environmentally unfriendly
electroplating methods. In addition, "solder jet" technology is flexible (patterns can be input
by keyboard) and capable of very fine pitch between solder deposits (< 100 µm). These
capabilities are needed for the next generation of microelectronic packaging.
The NIST Metallurgy Division is working closely with ATP Awardee MicroFab
Technologies, of Plano, Texas, and a consortium including Delco Electronics, AMP, Universal
Instruments, Texas Instruments, Eastman Kodak, and Motorola, to bring ink jet technology
closer to commercial reality. NIST scientists are focusing on materials compatibility issues
involving the liquid solder and the jetting apparatus, and reactions between the jetted solder
and the various substrate materials used in microelectronic interconnects.
Technical Objectives:
- Provide technical assistance to MicroFab in issues of materials compatibility.
- Collaborate with MicroFab and its customers in determining system requirements for
reliable solder jet operation and for product (solder joint) performance.
- Characterize the behavior of solder jet deposits under a range of deposition conditions
and substrates, including joints fabricated through reflow.
Anticipated Outcome:
- Materials compatibility issues of next generation devices for creating solder patterns
will be developed.
- Solder joint formation after reflow for solder deposited using jet technology will be
better understood.
Accomplishments for FY 1995:
- Interfacial reactions associated with containment of Pb/Sn solders in stainless steel
reservoirs have been identified and possible solutions to the concomitant contamination
have been investigated.
- Problems associated with oxidizing atmospheres during jetting have been identified.
Improvements in jetting and in deposit morphology using controlled atmospheres were
characterized.
- Identification of processing windows for substrate temperature, jet height, etc., which
allow necessary wetting of substrates but without excessive interfacial reaction.
Certain conditions unfavorable to reflow were also found.
- Evaluation of physical and mechanical property data for In-Sn alloys which are
necessary for ultrasonic jetting devices. These data were supplied to MicroFab in the
form of a computer program which provides data for any composition and
temperature.
Impacts and Technical Highlights:
- Our identification of solder oxidation problems contributed to MicroFab's decision to
add nitrogen co-flow to the solder jet apparatus. This control of oxygen is necessary
for MicroFab's milestones both for operation of the solder jet and for formation of
reliable solder joints.
- Wettability problems which we have identified with respect to copper substrates have
led to investigations of means (such as imidazole coatings) to enhance wettability.
This is essential for MicroFab's milestone to form reliable solder joints with solder jet
technology.
- Research at the Metallurgy Division has identified temperature regimes which are
suitable for deposition onto Au-coated silicon. This is essential for MicroFab's
milestone to form reliable solder joints with solder jet technology.
- The amount and valence of oxide formed on copper coupons aged under different
conditions can be determined by galvanostatic reduction. Reproducibility within a
given set of coupons is quite good. Cu2O was the primary species detected for all
levels of aging; however, two of the aging conditions resulted in 1-2 monolayers of
CuO on the outer surface.
- Electrochemical reduction is an excellent technique for determining the oxidation state
of copper, both qualitatively and quantitatively. These measurements can be
performed directly on printed wiring boards and component leads and may eventually
be used to assess solderability.
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Last modified: Mon Jan 06 09:46:15 1997
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